The Journal of Gemmology - Volume 35 No. 3 2016
- Published in 2016
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Additional plots to accompany Figure 8 of the article:
Wang H.A.O., Krzemnicki M.S., Chalain J.P., Lefèvre P., Zhou W. and Cartier L.E., 2016. Simultaneous high sensitivity trace-element and isotopic analysis of gemstones using laser ablation inductively coupled plasma time-of-flight mass spectrometry. Journal of Gemmology, 35(3), 212–223, http://dx.doi.org/10.15506/JoG.2016.35.3.212.
